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Jitter and decision-level noise separation in A/D converters

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5 Author(s)
R. J. W. T. Tangelder ; MESA Res. Inst., Twente Univ., Enschede, Netherlands ; H. de Vries ; R. Rosing ; H. G. Kerkhoff
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Gaussian aperture jitter leads to a reduced SNR of A/D converters. Also other noise sources, faults and nonlinearities affect the digital output signal. A measurement setup for a new off-chip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtracting technique. High-level ADC simulations and measurements have been carried out to determine relations between the size of the jitter or decision-level noise and the remaining random errors. By carrying out two tests at two different input frequencies and using the simulation results, errors induced by decision-level noise can be removed

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Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE  (Volume:3 )

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