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Probabilistic design of integrated circuits with correlated input parameters

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3 Author(s)
Seifi, A. ; Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada ; Ponnambalam, K. ; Vlach, Jiri

This paper presents an application of advanced first-order second-moment (AFOSM) reliability method to probabilistic design of integrated circuits with correlated parameters. The method avoids the transformation to the space of uncorrelated parameters and provides a conservative estimate of the yield. Optimal nominal values are found such that the cost of tolerances is minimized while the desired yield is achieved. Numerical results are presented for a switched capacitor filter and verified by Monte Carlo simulation

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:18 ,  Issue: 8 )