Cart (Loading....) | Create Account
Close category search window

Characterization of dielectric materials with the finite-element method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Coccioli, Roberto ; Dept. of Electron. Eng., Florence Univ., Italy ; Pelosi, G. ; Selleri, S.

A technique to characterize homogeneous and inhomogeneous dielectric materials based on measurements and computations is presented. The first step of the method proposed consists of measuring the resonant frequencies of an arbitrarily shaped cavity containing an arbitrarily shaped sample of the material under test. In the second step, the measured data are used in two different algorithms, both based on the finite-element method, to solve for the dielectric constant

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:47 ,  Issue: 7 )

Date of Publication:

Jul 1999

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.