By Topic

Analytical expressions for harmonic distortion at low frequencies due to device mismatch in CMOS current mirrors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Bruun, Erik ; Dept. of Inf. Technol., Tech. Univ. Denmark, Lyngby, Denmark

One of the origins of harmonic distortion in current mirrors is the inevitable mismatch between the mirror transistors. In this brief, we examine both single current mirrors and complementary class-AB current mirrors, and develop analytical expressions for the mismatch-induced harmonic distortion. The expressions are verified through simulations and are used for a discussion of the impact of mismatch on harmonic distortion properties of CMOS current mirrors. The distortion model is combined with well-known statistical models for the device mismatch in order to establish a relation between geometrical parameters, distortion, and production yield. It is found that distortion levels somewhat below 1% can be attained by carefully matching the mirror transistors, but ultra-low distortion is not achievable,

Published in:

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on  (Volume:46 ,  Issue: 7 )