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Electrooptical sampling using 1.55-μm self-seeded semiconductor laser with soliton pulse compression

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6 Author(s)
O. Reimann ; Inst. fur Festkorperphys., Tech. Univ. Berlin, Germany ; D. Huhse ; E. Droge ; E. H. Bottcher
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We report on a compact, reliable and easy to use electrooptic sampling system based on a self-seeded semiconductor laser having a temporal resolution of <1 ps and a shot noise limited sensitivity of 1 mV. With an operating wavelength of 1.55 μm and 0.5-ps time jitter of the optical source, it is particularly suited for ultrahigh-speed devices and integrated circuits. For demonstration, results for an ultrafast metal-semiconductor-metal photodetector are presented.

Published in:

IEEE Photonics Technology Letters  (Volume:11 ,  Issue: 8 )