Cart (Loading....) | Create Account
Close category search window
 

A static finite element analysis of substation busbar structures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bergeron, D.A. ; Dept. of Electr. Eng., New Orleans Univ., LA, USA ; Trahan, R.E., Jr.

A dynamic finite element analysis (FEA) method has been shown in earlier research to accurately predict the mechanical response of power system substation busbar structures during short circuit faults. However, the dynamic method is computationally intensive and time consuming. A static finite element analysis is much faster than the dynamic analysis although it is not as accurate. This paper presents a procedure to scale the forces in a static FEA to provide reasonably accurate results. The proposed procedure accounts for the natural frequency and electrical damping of the busbar structure. It is hoped that the proposed method will be useful in allowing substation engineers to quickly check their preliminary design, reserving the dynamic finite element analysis for final design checkout

Published in:

Power Delivery, IEEE Transactions on  (Volume:14 ,  Issue: 3 )

Date of Publication:

Jul 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.