Thin structure deflection measurement

Deflection curvature is easily observed during bending of thin structures. There are, however, few practical means available for measuring it. As a consequence, curvature measurements are extremely rare. Strain is usually the preferred measurand of choice. This preference is disadvantageous in the case of thin structures because strain can then be so small that very high resolution sensors are required despite the apparently large deflection curvature. A method of measuring such curvature is presented in this paper. Its conceptual advantages over strain measurement include: (1) position-invariant readings throughout the structural section; (2) sameness of the true and apparent measurands irrespective of the microstructural effects introduced by the sensor; (3) higher sensitivity in the case of thin structures.