By Topic

VXIbus instruments: past, present and future

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Sarfi, T. ; 27629 Chagrin Blvd., Woodmere, OH, USA

After a brief introduction to the VXIbus specification which was designed to avoid obsolescence by being an open-architecture standard, some of the many events which have occurred in the last few years to make the VXIbus standard the main platform for test, measurement, and high-density data acquisition, are discussed

Published in:

Aerospace and Electronic Systems Magazine, IEEE  (Volume:14 ,  Issue: 6 )