Referenced Items are not available for this document.
A technique for performing statistical circuit design has been developed that provides the accuracy required for bipolar designs. This has been accomplished through the development of a prototype system, MSTAT (Motorola statistical analysis tool). The statistical techniques that MSTAT supports to determine circuit performance and yield are screening (Plackett-Burman) and RSM (response surface methodology) Monte Carlo analysis is used to predict circuit constraints using the derived polynomial equation produced by RSM. An example is included to demonstrate the system capabilities.<
Published in:
Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
Date of Conference: 5-9 Nov. 1989
- Page(s):
- 198 - 201
- Meeting Date :
- 05 Nov 1989-09 Nov 1989
- Print ISBN:
- 0-8186-1986-4
- INSPEC Accession Number:
- 3695648
- Conference Location :
- Santa Clara, CA, USA
- Digital Object Identifier :
- 10.1109/ICCAD.1989.76935
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