Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Modeling and performance analysis of a symmetric fast-circuit switched robust-WDM LAN with the AR/LTP protocol

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
El-Bawab, T.S. ; Alcatel Corp. Res. Centre, Richardson, TX, USA ; Jayasumana, A.P.

Robust wavelength division multiplexing (WDM) is a technique to implement WDM local area networks (LAN's) in the presence of laser wavelength drifts. A medium access control (MAC) protocol is used in conjunction with a wavelength-tracking receiver to tolerate the variations of transmission wavelengths. Among the proposed medium access schemes, the aperiodic reservation (AR) scheme with token-passing based control channel gives the best performance. An AR protocol with a lenient token passing policy (AR/LTP) is thus presented. An analytical model is developed to design Robust-WDM AR/LTP LAN's and predict their performance characteristics. The model can be used to evaluate the variation of waiting time and throughput for load and network parameters such as the arrival rate, number of nodes, number of channels and timing parameters. It also addresses the issues related to traffic loss, channel-blocking, token rotation time, network span, and the effect of device parameters

Published in:

Lightwave Technology, Journal of  (Volume:17 ,  Issue: 6 )