By Topic

An architecture for self-test of a wireless communication system using sampled IQ modulation and boundary scan

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Heutmaker, Michael S. ; Bell Labs., Lucent Technol., Princeton, NJ, USA ; Le, D.K.

An architecture for system-level self-test of a wireless communication transceiver integrates the functional (parametric) self-test of the radio frequency subsystem, and the structural self-test of the digital subsystem. The digital subsystem is tested using extensions of the IEEE 1149.1 boundary scan standard to verify connections within circuit boards and between boards. The RF subsystem is tested using a loopback connection between the RF transmitter and receiver. An RF parametric self-test is performed using a digitally modulated signal (as opposed to a sinusoidal tone) as the test stimulus, and using samples from the receiver digitizer as test data. This loopback test scheme imposes a relatively small overhead on the RF system design

Published in:

Communications Magazine, IEEE  (Volume:37 ,  Issue: 6 )