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Diagnostic of high speed analog circuits using DC conditions

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2 Author(s)
Gracios Marin, C.A. ; ITV, INAOE, Puebla, Mexico ; Sarmiento Reyes, L.A.

This paper focuses attention on the problem of analog nonlinear circuit diagnostics when a circuit with multiple DC solutions has a fault in any element and the possibility of locating the fault in the circuit is complicated due to the change in the number of solutions. Several improvements have been tried to include the gain in differents models in electronic devices like diodes, bipolar or MOS transistors and to observe how the analysis changes when the designer uses a simple model.

Published in:

ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd

Date of Conference:

3-4 Dec. 1998