By Topic

Estimation of surface roughness parameters from dual-frequency measurements of radar backscattering coefficients

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
T. Mo ; Comput. Sci. Corp., Beltsville, MD, USA ; J. R. Wang ; T. J. Schmugge

A simple model was developed for estimating the surface roughness parameters of a bare soil field. The model uses a set of dual-frequency measurements of the field's radar backscattering coefficients, which can be matched to calculated results obtained with assumed values for the surface roughness parameters, as represented by the surface height standard deviation σ and its correlation lengths. Scatter plots of measured and calculated radar backscattering coefficients at the C -band (4.25-GHz) frequency versus those at L-band (1.5 GHz) show that it is feasible to estimate the surface roughness parameters using this technique. The estimated values for σ are in excellent agreement with those of measurements. However, there are discrepancies between the estimated and measured values for the correlation length L. For a very rough field, the geometrical optics model could be more appropriate for modeling the C-band data

Published in:

IEEE Transactions on Geoscience and Remote Sensing  (Volume:26 ,  Issue: 5 )