By Topic

Statistical analyses of measured radar ground clutter data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Billingsley, J.B. ; Lincoln Lab., MIT, Lexington, MA, USA ; Farina, A. ; Gini, F. ; Greco, M.V.
more authors

The performance of ground-based surveillance radars strongly depends on the distribution and spectral characteristics of ground clutter. To design signal processing algorithms that exploit the knowledge of clutter characteristics, a preliminary statistical analysis of ground-clutter data is necessary. We report the results of a statistical analysis of X-band ground-clutter data from the MIT Lincoln Laboratory Phase One program. Data non-Gaussianity of the in-phase and quadrature components was revealed, first by means of histogram and moments analysis, and then by means of a Gaussianity test based on cumulants of order higher than the second; to this purpose parametric autoregressive (AR) modeling of the clutter process was developed. The test is computationally attractive and has constant false alarm rate (CFAR). Incoherent analysis has also been carried out by checking the fitting to Rayleigh, Weibull, log-normal, and K-distribution models. Finally, a new modified Kolmogorov-Smirnoff (KS) goodness-of-fit test is proposed; this modified test guarantees good fitting in the distribution tails, which is of fundamental importance for a correct design of CFAR processors

Published in:

Aerospace and Electronic Systems, IEEE Transactions on  (Volume:35 ,  Issue: 2 )