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Browse Journals & Magazines > Design & Test of Computers, I ...> Volume:16 Issue:2 Help

Mixed-signal test bus, embedded core test efforts advance

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1 Author(s)
Modi, M.

First Page of the Article

Published in:
Design & Test of Computers, IEEE  (Volume:16 ,  Issue: 2 )

Date of Publication: April-June 1999

Page(s):
5 - 93
ISSN :
0740-7475
Digital Object Identifier :
10.1109/MDT.1999.765189
Product Type:
Journals & Magazines
Date of Current Version :
06 August 2002
Issue Date :
April-June 1999
Sponsored by :
IEEE Council on Electronic Design and Automation

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