Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Optical heterodyne force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kumano, N. ; Fac. of Eng., Hokkaido Univ., Sapporo, Japan ; Inagaki, K. ; Kolosov, O.V. ; Wright, O.B.

We present a new technique, Optical Heterodyne Force Microscopy, that allows local probing of photothermally-induced ultrasonic vibrations of a sample surface. We demonstrate with images of a sample of highly-oriented pyrolytic graphite obtained at megahertz optical modulation frequencies that lateral resolution of surface and subsurface variations in thermal properties can be achieved on nanometer scales

Published in:

Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE  (Volume:2 )

Date of Conference:

1998