By Topic

Phase shift determination of imperfect open calibration standards

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Biddle, G. ; Amp Inc., Harrisburg, PA, USA

A novel measurement technique for determining the inherent phase shift of open calibration standards for network analyzers due to fringing capacitance is presented. The resultant phase shift is directly measured using an uncalibrated network analyzer and requires no modeling of coefficients of capacitance as conventional methods do. An exact expression for the phase shift of an imperfect open is derived for each frequency point. Two sets of standard one-port error equations are developed for the application. The traditional set of calibration standards, the match, short, and imperfect open, are used. The standards are measured twice: once at the reference plane and then offset by a precision piece of air line. Results are presented for the phase shifts of a few open calibration standards at discrete frequencies

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:39 ,  Issue: 4 )