Cart (Loading....) | Create Account
Close category search window
 

A deconvolution technique for improved estimation of rapid changes in ion concentration recorded with ion-selective microelectrodes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Tucker, J.L. ; Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA ; Wen, R. ; Oakley, B., II

In the vertebrate retina, a knowledge of the actual time course of a light-evoked increased in extracellular K + concentration is used to provide a rigorous test of a hypothesis regarding the electrical origin of a clinically important component of the electroretinogram (ERG). A deconvolution technique is used to improve the estimation of the actual time course of the light-evoked increase in (K +) 0, and it is demonstrated that the ionic change is likely to be as rapid in time course (both latency and time-to-peak) as the b-wave. This result has rejected one of the strong challenges to the K + hypothesis, namely, that the light-evoked increase in (K +) 0 was too slow to produce the b-wave. The use of the deconvolution technique is a significant improvement on the much less rigorous method in which the ERG was filtered by a low-pass filter. The technique should have widespread applications in many areas of physiology and neuroscience where it is critical to know the exact time course of stimulus-evoked changes in ion concentration.

Published in:

Biomedical Engineering, IEEE Transactions on  (Volume:38 ,  Issue: 2 )

Date of Publication:

Feb. 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.