Close category search window
 

A minimum cross-entropy approach to hidden Markov model adaptation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Afify, M. ; Dept. of Electr. Eng., Cairo Univ., Fayoum, Egypt ; Gong, Yifan ; Haton, J.-P.

An adaptation algorithm using the theoretically optimal maximum a posteriori (MAP) formulation, and at the same time accounting for parameter correlation between different classes is desirable, especially when using sparse adaptation data. However, a direct implementation of such an approach may be prohibitive in many practical situations. We present an algorithm that approximates the above mentioned correlated MAP algorithm by iteratively maximizing the set of posterior marginals. With some simplifying assumptions, expressions for these marginals are then derived, using the principle of minimum cross-entropy. The resulting algorithm is simple, and includes conventional MAP estimation as a special case. The utility of the proposed method is tested in adaptation experiments for an alphabet recognition task.

Published in:
Signal Processing Letters, IEEE  (Volume:6 ,  Issue: 6 )

Date of Publication: June 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.