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100×100 optoelectronic cross-connect interconnects using OPTOBUS

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4 Author(s)
Ai, Jun ; NEC Res. Inst., Princeton, NJ, USA ; Yao Li ; Ting Wang ; Shum, Kai

This paper demonstrates an OPTOBUS-based fully packaged optoelectronic cross-connect interconnect technique for data communication applications. Optical insertion loss of the compact 100×100 cross-connect interconnect device ranges from 0.4 to 2.9 dB among all possible connections. Optical transmissions with bit error rate (BER) of >10-12 can be maintained at per channel bandwidth of 900 Mb/s. The system is expected to have an aggregated interconnect bandwidth near 100 Gb/s when being fully connected with the OPTOBUS chips

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Lightwave Technology, Journal of  (Volume:17 ,  Issue: 5 )