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A method to diagnose faults in linear analog circuits using an adaptive tester

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3 Author(s)
E. F. Cota ; Dept. de Engenharia Eletrica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil ; L. Carro ; M. Lubaszewski

This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behaviour in a first step, and comparing this behaviour against the output of the circuit under test in a second step. Considering the same basic structure, the diagnosis method consists on injecting probable faults in a mathematical model of the circuit and later comparing its output with the output of the real faulty circuit. This method has been successfully applied to a case study, a biquad filter. Component soft, large, and hard deviations, and faults in operational amplifiers were considered. The results obtained from practical experiments with this analog circuit are discussed in the paper.

Published in:

Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings

Date of Conference:

9-12 March 1999