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Glitch power minimization by gate freezing

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6 Author(s)

This paper presents a technique for glitch power minimization in combinational circuits. The total number of glitches is reduced by replacing some existing gates with functionally equivalent ones (called F-gates) that can be "frozen" by asserting a control signal. A frozen gate cannot propagate glitches to its output. An important feature of the proposed method is that it can be applied in-place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.

Published in:

Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings

Date of Conference:

9-12 March 1999

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