By Topic

Higher product complexity and shorter development time - continuous challenge to design and test environment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Junkkari, J. ; VP Adv. Dev., Nokia Mobile Phones, Finland

Digital technologies enable more functionality and new attractive products at faster pace. What are the challenges faced in the development? How must the processes change? How must the tools change? How must the businesses change? What are the strategic questions to be answered? The author gives consideration to this.

Published in:

Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings

Date of Conference:

9-12 March 1999