By Topic

1/f noise and specific detectivity of HgCdTe photodiodes passivated with ZnS-CdS films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Y. K. Su ; Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan ; Fuh-Shyang Juang ; Shing-Ming Chang ; Cheng-Der Chiang
more authors

1/f noise in HgCdTe photodiodes has been measured as a function of temperature, diode bias, and dark current. The dependence of 1/f noise on dark current was measured over a wide temperature range. At low temperatures, where surface generation and leakage current were predominant, a linear relationship between 1/f noise and dark current was observed. At higher temperatures, where diffusion current is predominant, the correlation no longer holds. The temperature dependence of 1/f noise was also determined. The temperature dependence of the 1/f noise was found to be the same as that for the surface generation and leakage currents. All the data obtained in these experiments could be fit with theoretical predictions by a simple relationship between 1/f noise and dark current. The 1/f noise in the HgCdTe photodiode varies with diode bias, temperature, and dark current only through the dependence of the surface current on these devices. The maximum specific detectivity (D*) value and the maximum signal-to noise ratio are approximately 3.51×1010 cm·Hz1/2/W and 5096 at 50 mV reverse bias, respectively

Published in:

IEEE Journal of Quantum Electronics  (Volume:35 ,  Issue: 5 )