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An adaptive BIST to detect multiple stuck-open faults in CMOS circuits

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3 Author(s)
Rahaman, H. ; Dept. of Electr. Eng., A.P.C. Roy Polytech., Calcutta, India ; Das, D.K. ; Bhattacharya, B.B.

Design of an adaptive built-in-self-test (BIST) scheme for detecting multiple stuck-open faults in a CMOS complex cell is proposed. The test pattern generator (TPG) adaptively generates a subset of single-input-change (SIC) test pairs based on the past responses of the circuit under test (CUT). The design is universal, i.e., independent of the structure and functionality of the CUT. The average length of the test sequence (TS) in an n-input CUT is (n+1).2n [(n+1).2n-1] in a fault-free [faulty] condition. The response analyzer (RA) is also simple to design. All robustly testable multiple stuck-open faults (occurring simultaneously both in n- and p-parts) can be detected using the proposed BIST scheme

Published in:

Design Automation Conference, 1999. Proceedings of the ASP-DAC '99. Asia and South Pacific

Date of Conference:

18-21 Jan 1999

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