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A hybrid wafer-dicing process for GaAs MMIC production

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5 Author(s)
E. Y. Chang ; Comsat Lab., Clarksburg, MD, USA ; R. Dean ; J. Proctor ; R. Elmer
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A dicing process for GaAs MMIC (monolithic microwave integrated circuit) wafers using spin-on wax for wafer mounting and a hybrid process of wet chemical etching/mechanical sawing for chip dicing is described. This process minimizes ragged chip edges and reduces generation of microcracks in addition to the elimination of the plated gold burrs on the backside of the diced MMIC chips. This process gives a uniformity of -3 μm across a 2-in wafer following the completion of the whole backside process. This GaAs chip dicing technique is amenable to production because it exhibits both a very high chip yield (>90%) and nearly flawless edges

Published in:

IEEE Transactions on Semiconductor Manufacturing  (Volume:4 ,  Issue: 1 )