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Application of linearly independent arithmetic transform in testing of digital circuits

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2 Author(s)
Rahardja, S. ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore ; Falkowski, B.J.

Recently introduced linearly independent arithmetic (LIA) transforms and their corresponding spectral coefficients are used to detect faults in digital circuits. The results show that for many classes of logical functions, the LIA logic transformations are advantageous in terms of the number of their coefficients that have to be checked to identify the faults when compared to the case of the well-known arithmetic transform

Published in:

Electronics Letters  (Volume:35 ,  Issue: 5 )