By Topic

Application of linearly independent arithmetic transform in testing of digital circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $33
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
S. Rahardja ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore ; B. J. Falkowski

Recently introduced linearly independent arithmetic (LIA) transforms and their corresponding spectral coefficients are used to detect faults in digital circuits. The results show that for many classes of logical functions, the LIA logic transformations are advantageous in terms of the number of their coefficients that have to be checked to identify the faults when compared to the case of the well-known arithmetic transform

Published in:

Electronics Letters  (Volume:35 ,  Issue: 5 )