By Topic

Microcontroller-based system for multiple ISFET characterization using a single reference electrode

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mayorga V., O. ; Dept. de Ingeneria Eletrica, Inst. Politecnico Nacional, Mexico City, Mexico ; Aldana A., G. ; Rodriguez P., H.

An instrument for multiple ISFET electrical characterization has been developed. The system allows, multiple and simultaneously active, ISFET characterization sharing a single reference electrode. This was possible by using multiple isolated power sources. Isolation amplifiers with embedded isolated power outputs were used instead. The instrument makes use of the constant current biasing mode to ensure ISFET's linearity at differential gate potential variations. An important feature of this system is the capability to determine the stabilization point from the characteristic of measured ISFETs. A stabilization point criterion is evaluated constantly during initial stages of individual operating conditions. Due to the rather low sampling rate, floating point and A/D conversion operations, a microcontroller device was decided to be used as optimal solution. The system uses a real time clock in order to keep a temporal relationship of sampled data. Preprogrammed sampling rate routines can be chosen for long or short evaluation periods. The instrument possesses stand alone features, so it could be used without an attached computer. Results showed linearity, low noise and reliable and easy operation. This measuring system represents a low cost effective solution in experimental chemical laboratories where ISFETs are being tested

Published in:

Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE  (Volume:6 )

Date of Conference:

30 Oct-2 Nov 1997