Cart (Loading....) | Create Account
Close category search window
 

Error rate equations for the general biometric system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Wayman, J.L. ; Nat. Biometric Center, San Jose State Univ., CA, USA

We derive equations for false-match and false-nonmatch error-rate prediction for the general M-to-N biometric identification system, under the simplifying, but limiting, assumption of statistical independence of all errors. For systems with large N, error rates are shown to be linked to the hardware processing speed through the system penetration coefficient and the throughput equation. These equations are somewhat limited in their ability to handle sample-dependent decision policies and are shown to be consistent with previously published cases for verification and identification. Applying parameters consistent with the Philippine Social Security System benchmark test results for AFIS vendors, we establish that biometric identification systems can be used in populations of 100 million people. Development of more generalized equations, accounting for error correlation and general sample-dependent thresholds, establishing confidence bounds, and substituting the inter-template for the impostor distribution under the template generating policy remain for future study

Published in:

Robotics & Automation Magazine, IEEE  (Volume:6 ,  Issue: 1 )

Date of Publication:

Mar 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.