By Topic

Guiding effects in Nd:YVO4 microchip lasers operating well above threshold

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kemp, A.J. ; Sch. of Phys. & Astron., Univ. of St. Andrews, UK ; Conroy, R.S. ; Friel, G.J. ; Sinclair, B.D.

Guiding of the transverse mode in Nd:YVO4 microchip lasers is examined both experimentally and theoretically at pump powers well above threshold. It is found that thermal changes in the cavity geometry induced by intense diode pumping can be well understood using a simple model. However, an understanding of these effects is not sufficient to explain the nature of the transverse mode. Gain-related guiding effects are found to play an important role even at pump powers well above threshold. For a 0.5-mm-thick microchip laser, a difference of around 30% is observed between the minimum beam waist expected due to thermal guiding and the measured beam waist. The gain-related effects are described theoretically and their importance is demonstrated experimentally

Published in:

Quantum Electronics, IEEE Journal of  (Volume:35 ,  Issue: 4 )