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Reliability prediction of solid dielectrics using electrical Noise as a screening parameter

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3 Author(s)
Misra, R. ; New Jersey Inst. of Technol., Newark, NJ, USA ; Pandey, S. ; Sundaresan, V.

The use of electrical noise for the screening of dielectric sheet material for reliability is studied. Results are presented which indicate that high-noise units have a greater failure rate compared to low-noise units when subjected to identical voltage and temperature stresses. Data for the various solid dielectric sheet materials and small transformers tested are presented

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Reliability, IEEE Transactions on  (Volume:40 ,  Issue: 1 )