Referenced Items are not available for this document.
Integrated circuit pad-to-pad crosstalk characterization structures were fabricated and measured over a 8000 μm×2500 μm area using Al pads on a silicon substrate. The structures were tested by a pure-mode network analyzer to yield common- and differential-mode crosstalk at 1 and 2 GHz. Differential-mode signals introduce far less substrate noise. This novel technique can characterize substrate noise levels near sensitive radio frequency (RF) and microwave circuits
Published in:
Microwave and Guided Wave Letters, IEEE
(Volume:9
,
Issue:
1
)
Date of Publication: Jan 1999
- Page(s):
- 25 - 27
- ISSN :
- 1051-8207
- INSPEC Accession Number:
- 6207648
- Digital Object Identifier :
- 10.1109/75.752113
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Jan 1999
- Sponsored by :
- IEEE Microwave Theory and Techniques Society
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