Cart (Loading....) | Create Account
Close category search window

Inverse scattering using the finite-element method and a nonlinear optimization technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rekanos, I.T. ; Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece ; Yioultsis, T.V. ; Tsiboukis, T.D.

A new spatial-domain technique for the reconstruction of the complex permittivity profile of unknown scatterers is proposed in this paper. The technique is based on a combination of the finite-element method (FEM) and the Polak-Ribiere nonlinear conjugate gradient optimization algorithm. The direct scattering problem is explicitly dealt with by means of the differential formulation and it is solved by applying the FEM. The inversion methodology is oriented to minimizing a cost function, which consists of a standard error term and regularization term. A sensitivity analysis, which is carried out by an elaborate finite-element procedure, results in the determination of the direction required for correcting the profile. Significant reduction of the computation time is obtained by introducing the adjoint state vector methodology. The efficiency of the presented inversion technique is validated by applying it to the inversion of synthetic scattered far-field measurements, which are corrupted by additive noise

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:47 ,  Issue: 3 )

Date of Publication:

Mar 1999

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.