A low cost dual methodology for characterizing microwave shielding gaskets over a wide frequency band

A solution is presented for the long-standing problem of characterizing microwave shielding gaskets. A dual methodology is proposed that employs near-field probes (NFP) at low frequencies and a small economical mode-stirred chamber (MSC) at high frequencies. It is intended for use by gasket manufacturers for characterizing practical commercial gasketed seams. Simple in-house fabricated probes are the only additional equipment needed beyond that employed for the MSC method alone. The entire frequency range from VHF to high microwave can be covered-with a wide overlapping frequency region that provides direct comparison of data obtained with the very different NFP and MSC methods. Cooperative efforts are being started to implement the dual methodology method with gasket manufacturers.