Cart (Loading....) | Create Account
Close category search window
 

A ferroelectric cathode, electron gun for high power microwave research

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Ivers, J.D. ; Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA ; Flechtner, D. ; Golkowski, Cz. ; Kerslick, G.S.
more authors

A pulse modulator, previously described at the 1995 PAC meeting, has been reconfigured to improve the pulse shape at a slightly lower beam energy, but with a higher current (500 kV, 1kA). The device has been run at rated voltage and current into a resistive load for pulse durations in excess of 250 ns and at ~0.1 Hz repetition rate. The modulator, which is designed for use in our high power microwave research program, has been coupled to an electron gun which uses a ferroelectric cathode and has been operated in this mode producing a 500 kV, 200 A electron beam. We report in this paper on the revised design and performance of the modulator and present preliminary data on the electron gun design and characteristics

Published in:

Particle Accelerator Conference, 1997. Proceedings of the 1997  (Volume:1 )

Date of Conference:

12-16 May 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.