Referenced Items are not available for this document.
To check the accuracy of the measurements of microwave noise parameters, verification techniques are needed. A common-gate cold FET is proposed as a noise verification standard which presents the advantage of good availability and insertability in the same test jig as employed for packaged active devices. In addition the noise parameters of a common-gate cold FET are of the same order of magnitude as the active device ones. The presented experimental data show an accuracy better than 0.1 dB on the minimum noise figure measurement.
Published in:
Electronics Letters
(Volume:27
,
Issue:
10
)
Date of Publication: 9 May 1991
- Page(s):
- 833 - 835
- ISSN :
- 0013-5194
- INSPEC Accession Number:
- 3930077
- Digital Object Identifier :
- 10.1049/el:19910522
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- 9 May 1991
- Sponsored by :
- Institution of Engineering and Technology
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