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Fuzzy-based CMOS circuit partitioning in built-in current testing

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2 Author(s)
Wang-Dauh Tseng ; Dept. of Comput. & Inf. Sci., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Kuochen Wang

We propose a fuzzy-based approach which provides a soft threshold to determine the module size for CMOS circuit partitioning in built-in current testing (BICT). Experimental results show that our design approach indeed provides a feasible way to exploit the design space of BICT partitioning in comparison with other approaches with a fixed threshold, and a better module size can thus be determined to reflect a change of circuit properties.

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:7 ,  Issue: 1 )