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Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

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2 Author(s)
V. Zajic ; Brookhaven Nat. Lab., Upton, NY, USA ; P. Thieberger

A heavy ion beam diagnostic system installed at the Brookhaven Single Event Upset Test Facility is described. Calibration of the system with the help of a-particles, essential for linear energy transfer (LET) measurements, is discussed. Measured LET values for 20 different ions, including 7Li, 9B, 12C, 16O, 19F, 28Si, 32S, 35Cl, 40Ca, 45Sc, 48Ti, 56Fe, 58Ni, 63Cu, 74Ge, 79Br, 107Ag, 127I, 197Au, and 235U, with energies between 0.5 and 8.5 MeV/AMU but not exceeding 400 MeV for the heaviest ions, are presented in both graphical and numerical forms. Results are compared to predictions of the TRIM-90 simulation program, with an average difference between the measured and calculated values of 2±6%

Published in:

IEEE Transactions on Nuclear Science  (Volume:46 ,  Issue: 1 )