Cart (Loading....) | Create Account
Close category search window
 

An exact and direct analytical method for the design of optimally robust CNN templates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hanggi, M. ; Signal & Inf. Process. Lab., Fed. Inst. of Technol., Zurich, Switzerland ; Moschytz, George S.

In this paper, we present an analytical design approach for the class of bipolar cellular neural networks (CNN's) which yields optimally robust template parameters. We give a rigorous definition of absolute and relative robustness and show that all well-defined CNN tasks are characterized by a finite set of linear and homogeneous inequalities. This system of inequalities can be analytically solved for the most robust template by simple matrix algebra. For the relative robustness of a task, a theoretical upper bound exists and is easily derived, whereas the absolute robustness can be arbitrarily increased by template scaling. A series of examples demonstrates the simplicity and broad applicability of the proposed method

Published in:

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on  (Volume:46 ,  Issue: 2 )

Date of Publication:

Feb 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.