Cart (Loading....) | Create Account
Close category search window

Type II codes over F2+uF2

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Dougherty, S.T. ; Dept. of Math., Univ. of Scranton, PA, USA ; Gaborit, P. ; Harada, M. ; Sole, P.

The alphabet F2+uF2 is viewed here as a quotient of the Gaussian integers by the ideal (2). Self-dual F2 +uF2 codes with Lee weights a multiple of 4 are called Type II. They give even unimodular Gaussian lattices by Construction A, while Type I codes yield unimodular Gaussian lattices. Construction B makes it possible to realize the Leech lattice as a Gaussian lattice. There is a Gray map which maps Type II codes into Type II binary codes with a fixed point free involution in their automorphism group. Combinatorial constructions use weighing matrices and strongly regular graphs. Gleason-type theorems for the symmetrized weight enumerators of Type II codes are derived. All self-dual codes are classified for length up to 8. The shadow of the Type I codes yields bounds on the highest minimum Hamming and Lee weights

Published in:

Information Theory, IEEE Transactions on  (Volume:45 ,  Issue: 1 )

Date of Publication:

Jan 1999

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.