Close category search window
 

Short-range microwave inverse scattering techniques for image reconstruction and applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Pastorino, M. ; Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy

This paper deals with microwave imaging techniques based on electromagnetic inverse scattering and devoted to nondestructive testing, civil engineering, and scientific and medical applications. In particular, the focus is on spatial-domain algorithms for short-range reconstruction of dielectric objects. Some of the most significant approaches recently proposed in the literature are considered and some trends of the present research activity on this topic are briefly discussed, although it is really difficult to establish precise directions for this research, as the range of proposal is now very wide and the related activities evolve rapidly. Finally, two stochastic inversion methodologies are presented and questions concerning their effectiveness in the light of practical applications are addressed

Published in:
Instrumentation and Measurement, IEEE Transactions on  (Volume:47 ,  Issue: 6 )

Date of Publication: Dec 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.