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Code probability distributions of A/D converters with random input noise

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1 Author(s)
Souders, T.M. ; Lab. of Electron. & Electr. Eng., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the output codes of successive approximation A/D converters have a spiked distribution, and its variance is half that of the corresponding input noise. In addition, the distribution has a small bias. These and other related results are derived, and are qualitatively supported by measurement data on a real 16-bit A/D converter

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Instrumentation and Measurement, IEEE Transactions on  (Volume:47 ,  Issue: 5 )