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Parameter extraction and electrical characterization of high density connector using time domain measurements

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3 Author(s)
Pannala, Sreemala ; Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA ; Haridass, A. ; Swaminathan, M.

Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. A systematic parameter extraction algorithm has been discussed in this paper using time domain reflectometry (TDR) measurements. This method uses a combination of stand-alone, common mode, and differential mode measurements to extract the connector parasitics. The accuracy of the equivalent circuit has been studied in detail using crosstalk measurements

Published in:

Advanced Packaging, IEEE Transactions on  (Volume:22 ,  Issue: 1 )

Date of Publication:

Feb 1999

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