IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Electron Devices Meeting, 199 ... Help

Device design methodology to optimize low-frequency noise in advanced SOI CMOS technology for RF ICs

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Ying-Che Tseng ; Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA ; Huang, W.M. ; Mendiciono, M. ; Ngo, D.
more authors

This paper reports on a comprehensive study of low-frequency (LF) noise in surface-channel dual-poly SOI CMOS-FETs. A new understanding of the pre-kink and post-kink excess noise mechanisms as well as the impact of this excess noise on RF ICs are presented.

Published in:
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International

Date of Conference: 6-9 Dec. 1998

Page(s):
949 - 952
Meeting Date :
06 Dec 1998-09 Dec 1998
ISSN :
0163-1918
Print ISBN:
0-7803-4774-9
INSPEC Accession Number:
6189808
Conference Location :
San Francisco, CA, USA
Digital Object Identifier :
10.1109/IEDM.1998.746511
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.