By Topic

Statistical screening, selection, and multiple comparison procedures in computer simulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Goldsman, David ; Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA ; Nelson, B.L.

We present a state-of-the-art review of screening, selection, and multiple comparison procedures that are used to compare system designs via computer simulation. We describe methods for three broad classes of problems: screening a large number of system designs, selecting the best system, and comparing all systems to a standard (either known or unknown). We concentrate primarily on recent methods that we would be likely to use in practice. Where possible, we unify the screening, selection, and multiple comparison perspectives

Published in:

Simulation Conference Proceedings, 1998. Winter  (Volume:1 )

Date of Conference:

13-16 Dec 1998