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An integration of memory-based analog signal generation into current DFT architectures

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2 Author(s)
Hawrysh, E.M. ; Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada ; Roberts, G.W.

One method for the testing of mixed analog/digital integrated circuits involves the digital encoding of analog signals into an aperiodic pulse-density modulated (PDM) serial bit stream and using it to stimulate a device under test (DUT). This paper describes a method for obtaining a short periodic approximation of the PDM pattern and identifies two methods of integrating this analog test scheme into the current digital test environment: RAM- and scan-based storage. Using such design-for-test logic as the 1149.1-1990 JTAG architecture and a typical RAMBIST controller, these analog signal generation techniques can be added to digital integrated circuits (IC's) with minimal additional hardware overhead

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:47 ,  Issue: 3 )

Date of Publication:

Jun 1998

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