Cart (Loading....) | Create Account
Close category search window
 

Neural-network-based method of calibration and measurand reconstruction for a high-pressure measuring system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Massicotte, D. ; Dept. d''Ingenierie, Quebec Univ., Trois-Rivieres, Que., Canada ; Legendre, S. ; Barwicz, A.

The problem of applying the neural networks for static calibration of measuring systems and for measurand reconstruction is addressed. A multilayered neural network based method for the static calibration of this system is proposed. The functioning of the calibrated measuring system is based on three fiber-optic transducers whose static characteristics are nonmonotonic and significantly influenced by temperature. The applicability of the proposed calibration method is demonstrated in the case under consideration using synthetic and real data. The neural network is designed and implemented in a general purpose microcontroller. In comparison with the spline-based method of calibration, for the same reference data, the proposed method allows obtention of a better quality of calibration and, most important, when calibrated, the multilayered neural network does not require the measurement of temperature for pressure reconstruction

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:47 ,  Issue: 2 )

Date of Publication:

Apr 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.