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Substrate optimization based on semi-analytical techniques

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4 Author(s)
Charbon, E. ; Cadence Design Syst. Inc., San Jose, CA, USA ; Gharpurey, R. ; Meyer, R.G. ; Sangiovanni-Vincentelli, A.

Several methods are presented for highly efficient calculation of substrate noise transport in integrated circuits. A three-dimensional Green's function-based boundary element method, accelerated through use of the fast Fourier transform, allows the computation of sensitivities with respect to all substrate parameters at a considerably higher speed than any methods reported in the literature. Substrate sensitivities are used in a number of physical optimization tools, such as placement and trend analysis. The aim is a fast and accurate estimation of the impact of technology migration and/or layout redesign on substrate noise and, ultimately, on the circuit's overall performance. The suitability of the approach is shown through industrial-strength mixed-mode integrated circuits fabricated on a standard CMOS process

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:18 ,  Issue: 2 )

Date of Publication:

Feb 1999

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