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On applying non-classical defect models to automated diagnosis

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7 Author(s)
Saxena, J. ; Texas Instrum. Inc., Dallas, TX, USA ; Butler, K.M. ; Balachandran, H. ; Lavo, D.B.
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Automated fault diagnosis based on the stuck-at fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis technique to a TI ASIC design. Results are presented for units into which known bridging defects have been introduced via a focused ion beam (FIB) machine

Published in:

Test Conference, 1998. Proceedings., International

Date of Conference:

18-23 Oct 1998