By Topic

Image processing and automated testing in flexible manufacturing systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mariño, P. ; Electron. Technol. Dept., Vigo Univ., Spain ; Dominguez, M.A.

The authors have been involved in the implementation of a total quality control project in a communications equipment company, whose products are mounted and tested in a manufacturing plant controlled by an IBM Token Ring LAN. The most significant products are RF and microwave amplifier boards for satellite TV receivers, with electronic components based on SMT technology. The first implementation of total quality control project was an ATE (automated test equipment) LAN node that runs a program of verification for single-channel and multichannel electronic amplifiers, of which the bandwidth is in the TV spectrum (50/850 MHz). This ATE LAN node is supported in its performance for a RF analyzer connected to it through an IEEE 488 bus. The last implementation is an automated inspection LAN node to detect the absence of SMT and non SMT components mounted in the electronic cards of above mentioned amplifiers. This LAN node for automated inspection is based on artificial vision and is called MVI (machine-vision inspection)

Published in:

SICE '98. Proceedings of the 37th SICE Annual Conference. International Session Papers

Date of Conference:

29-31 Jul 1998